NTID President Selected to Lead Gallaudet

NTID President Selected to Lead Gallaudet

NTID News – October 18, 2009

T. Alan Hurwitz, the president of the National Technical Institute for the
Deaf at Rochester Institute of Technology, has been selected to become the
next president of Gallaudet University in Washington, D.C.

Hurwitz was among the four finalists announced for the position in
September. The Gallaudet Board of Trustees announced their decision today
after an intensive search process culminating with in-depth interviews with
each of the four candidates.

Hurwitz came to NTID in 1970 after working as an engineer and computer
programmer for McDonnell-Douglas. He taught and served in various
administrative positions and has headed NTID since 2003.

Hurwitz will become Gallaudet’s 10th president in the university’s 145-year
history. His presidency will begin on Jan. 1.

RIT President Bill Destler expects to announce plans very soon for an
interim president to head NTID while a national search is conducted for
Hurwitz’s successor.

“It is with mixed emotions I accept this new challenge,” Hurwitz said. “I
look forward to helping Gallaudet continue to serve its students in an
environment that fosters the best educational opportunities for them. Yet I
am saddened to be leaving Rochester, the home my wife Vicki and I have known
for the past 40 years. We have raised our children here and have made
countless friends here. The RIT/NTID community will always hold a special
place in our hearts.

“I have assured President Destler that I will help the interim president
make a smooth transition. I leave NTID in good hands. We’ve never been in
better shape. Our applications continue to be strong. Enrollment is the
highest it has ever been in our 42-year history. Our students are still
finding good jobs upon graduation despite tough economic times. Our
reputation is well regarded in Washington and throughout the nation. And our
faculty and staff are dedicated, hard-working men and women who have a
passion for their mission here.”

Source: http://www.ntid.rit.edu/media/full_text.php?article_id=1060

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